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Publications

Google Scholar
Book and book chapters

  • F. Ganji, S. Tajik, Physically Unclonable Functions and AI. In Security and Artificial Intelligence. Springer, Cham, 2022.

  • S. Tajik, F. Ganji, Artificial neural networks and fault injection attacks. In Security and Artificial Intelligence. Springer, Cham, 2022. 

  • A. Covic, S. Chowdhury, R.Y. Acharya, F. Ganji, D. Forte, Post-Quantum Hardware Security: Physical Security in Classic vs. Quantum Worlds. in Emerging Topics in Hardware Security, Springer, 2021. 

  • F. Ganji, On the learnability of physically unclonable functions. Springer, 2018. 

Journal papers​

  • S. Shomaji, P. Ghosh, F. Ganji, D.L. Woodard, D. Forte, “An Analysis of Enrollment and Query Attacks on Hierarchical Bloom Filter-based Biometric Systems”, IEEE Transactions on Information Forensics and Security (TIFS), 2021. [impact factor: 6.21]

  • S. Shomaji, Z. Guo, F. Ganji, N. Karimian, D.L. Woodard, D. Forte, “BLOcKeR: A Biometric Locking Paradigm for IoT and the Connected Person”, Journal of Hardware and Systems Security (HaSS), 2021. [impact factor: NA]

  • U.J. Botero, R. Wilson, H. Lu, MT Rahman, M.A. Mallaiyan, F. Ganji, N. Asadizanjanizanjani, M.M. Tehranipoor, D.L. Woodard, D. Forte, “Hardware Trust and Assurance through Reverse Engineering: A Tutorial and Outlook from Image Analysis and Machine Learning Perspectives”, ACM Journal on Emerging Technologies in Computing Systems (JETC), Vol. 17, No. 4, June 2021. [impact factor: 1.42]

  • S. Chowdhury, A. Covic, R.Y. Acharya, S. Dupee, F. Ganji, D. Forte, “Physical Security in the Post-quantum Era: A Survey on Side-channel Analysis, Random Number Generators, and Physically Unclonable Functions”, Journal of Cryptographic Engineering (JCEN), 2021. [impact factor: 1.61]

  • S.M. Sohi, J.P. Seifert, F. Ganji. “RNNIDS: Enhancing Network Intrusion Detection Systems through Deep Learning”, Computers & Security (2021). [impact factor: 4.43]

  • S. Chowdury, F. Ganji, D. Forte, “Recycled SoC Detection using LDO Degradation”, SN Computer Science, September 2020. [impact factor: 1.29]

Conference papers​

  • M. Hashemi, S. Roy, F, Ganji, D. Forte, “Garbled EDA: Privacy Preserving Electronic Design Automation”, to appear International Conference on Computer-Aided Design (ICCAD), November 2022. [acceptance rate: ~22.5%]

  • U. Botero, F. Ganji, D. Woodard, D Forte, “Automated Trace and Copper Plane Extraction of X-ray Tomography Imaged PCBs”, IEEE International Conference on Physical Assurance and Inspection of Electronics (PAINE), December 2021. [acceptance rate: ~35%] 

  • T. Krachenfels, F. Ganji, A. Moradi, S. Tajik, J.P. Seifert, “Real-World Snapshots vs. Theory: Questioning the t-Probing Security Model,” IEEE Symposium on Security and Privacy, May 2021. [acceptance rate: ~12.6%]

  • R.Y. Acharya, N. Charlot, M.M. Alam, F. Ganji, D. Gauthier, D. Forte, “Chaogate Parameter Optimization using Bayesian Optimization and Genetic Algorithm”, International Symposium on Quality Electronic Design (ISQED’21), April 2021. [acceptance rate: ~35%]

  • R.Y. Acharya, S. Chowdhury, F Ganji, D. Forte, “Attack of the Genes: Finding Keys and Parameters of Locked Analog ICs Using Genetic Algorithm” IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), December 2020. [acceptance rate: ~20%]

  • U. Botero, F. Ganji, N. Asadizanjani, D.Woodard, D. Forte, “Semi-Supervised Automated Layer Identification of X-ray Tomography Imaged PCBs”, IEEE International Conference on Physical Assurance and Inspection of Electronics (PAINE), December 2020. [acceptance rate: ~35%]

  • P. Ghosh, U. Botero, F. Ganji, D. Woodard, R.S. Chakraborty, D. Forte, “Automated Detection and Localization of Counterfeit Chip Defects by Texture Analysis in Infrared (IR) Domain”, IEEE International Conference on Physical Assurance and Inspection of Electronics (PAINE), December 2020. [acceptance rate: ~35%]

  • U. Botero, D. Koblah, D.E. Capecci, F. Ganji, N. Asadi, D.L. Woodard, D. Forte, “Automated Via Detection for PCB Reverse Engineering”, International Symposium for Testing and Failure Analysis (ISTFA), December 2020. [acceptance rate: NA] 

  • S. Chowdhury, F. Ganji, D. Forte, “Low-Cost Remarked Counterfeit IC Detection Using LDO Regulators”, IEEE International Symposium on Circuits and Systems (ISCAS), October 2020. [acceptance rate: ~50%]

  • A. Covic, F. Ganji, D. Forte, “Circuit Masking Schemes: New Hope for Backside Probing Countermeasures?”, SRC TECHCON, September 2020.

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